Wei Zhan

• Zhan, Wei; Kosinskiy, Andrey; Vines, Lasse; Johansen, Klaus Magnus H; Almeida Carvalho, Patricia & Prytz, Øystein (2019). ZnCr2O4 Inclusions in ZnO Matrix Investigated by Probe-Corrected STEM-EELS. Materials. ISSN 1996-1944. 12. doi: 10.3390/ma12060888. Full text in Research Archive
• Jensen, Ingvild Julie Thue; Johansen, Klaus Magnus H; Zhan, Wei; Venkatachalapathy, Vishnukanthan; Brillson, Len & Kuznetsov, Andrej [Show all 7 contributors for this article] (2018). Bandgap and band edge positions in compositionally graded ZnCdO. Journal of Applied Physics. ISSN 0021-8979. 124(1), p. 015302-1–015302-8. doi: 10.1063/1.5036710. Full text in Research Archive
• Zhan, Wei; Venkatachalapathy, Vishnukanthan; Aarholt, Thomas; Kuznetsov, Andrej & Prytz, Øystein (2018). Band gap maps beyond the delocalization limit: correlation between optical band gaps and plasmon energies at the nanoscale. Scientific Reports. ISSN 2045-2322. 8(848), p. 1–7. doi: 10.1038/s41598-017-18949-9. Full text in Research Archive
• Granerød, Cecilie Skjold; Zhan, Wei & Prytz, Øystein (2018). Automated approaches for band gap mapping in STEM-EELS. Ultramicroscopy. ISSN 0304-3991. 184(A), p. 39–45. doi: 10.1016/j.ultramic.2017.08.006. Full text in Research Archive
• Zhan, Wei; Granerød, Cecilie Skjold; Venkatachalapathy, Vishnukanthan; Johansen, Klaus Magnus H; Jensen, Ingvild Julie Thue & Kuznetsov, Andrej [Show all 7 contributors for this article] (2017). Nanoscale mapping of optical band gaps using monochromated Electron Energy Loss Spectroscopy . Nanotechnology. ISSN 0957-4484. 28(10). doi: 10.1088/1361-6528/aa5962. Full text in Research Archive Show summary

  Using monochromated electron energy loss spectroscopy in a probe-corrected scanning transmission electron microscope we demonstrate band gap mapping in ZnO/ZnCdO thin films with a spatial resolution below 10 nm and spectral precision of 20 meV.

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• Granerød, Cecilie Skjold; Zhan, Wei & Prytz, Øystein (2017). Methods for Mapping the Band Gap with High Spatial Resolution by STEM-EELS.
• Granerød, Cecilie Skjold; Bilden, Sindre Rannem; Zhan, Wei; Vines, Lasse; Johansen, Klaus Magnus H & Prytz, Øystein (2017). Measuring the ZnO bandgap and its temperature dependency with STEM-EELS.
• Granerød, Cecilie Skjold; Zhan, Wei; Aarseth, Bjørn Brevig; Nguyen, Phuong Dan; Johansen, Klaus Magnus H & Vines, Lasse [Show all 7 contributors for this article] (2016). Bandgap measurements by STEM-EELS.
• Granerød, Cecilie Skjold; Zhan, Wei; Johansen, Klaus Magnus H; Vines, Lasse & Prytz, Øystein (2016). Band gap measurements by STEM EELS.
• Johansen, Klaus Magnus H; Zhan, Wei; Jensen, Ingvild Julie Thue; Granerød, Cecilie Skjold; Venkatachalapathy, Vishnukanthan & Brillson, Leonard J. [Show all 8 contributors for this article] (2016). Mapping of Optical band gaps using Electron Energy Loss Spectroscopy in ZnCdO-alloys.
• Granerød, Cecilie Skjold; Zhan, Wei; Aarseth, Bjørn Brevig; Vines, Lasse & Prytz, Øystein (2015). Band gap measurements by STEM EELS.
• Granerød, Cecilie Skjold; Zhan, Wei; Venkatachalapathy, Vishnukanthan; Kuznetsov, Andrej; Nilsen, Ola & Monakhov, Edouard [Show all 7 contributors for this article] (2015). Bandgap of Functional Oxides in STEM-EELS.
• Zhan, Wei; Kosinskiy, Andrey & Prytz, Øystein (2015). Aberration-corrected High-resolution STEM and EELS on Cr-doped ZnO with Nano ZnCr2O4 Inclusion.
• Zhan, Wei; Venkatachalapathy, Vishnukanthan; Jensen, Ingvild Julie Thue; Granerød, Cecilie Skjold; Flage-Larsen, Espen & Johansen, Klaus Magnus H [Show all 9 contributors for this article] (2015). STEM-EELS Band Gap Measurement in Zn1-XCdXO Thin Films.
• Granerød, Cecilie Skjold; Nguyen, Phuong Dan; Zhan, Wei; Monakhov, Edouard & Prytz, Øystein (2015). Band gap measurements by STEM-EELS.
• Granerød, Cecilie Skjold; Nguyen, Phuong Dan; Zhan, Wei; Monakhov, Edouard & Prytz, Øystein (2015). High Energy Resolution EELS on ZnO/Cu2O Heterostructures.
• Prytz, Øystein; Zhan, Wei & Granerød, Cecilie Skjold (2015). Status of EELS band gap measurements in the monochromated Titan.
• Zhan, Wei (2018). Bang gap mapping of alloyed ZnO using probe-corrected and monochromated STEM-EELS. Det matematisk-naturvitenskapelige fakultet.
• Zhan, Wei; Prytz, Øystein; Kuznetsov, Andrej & Flage-Larsen, Espen (2018). Band gap mapping of alloyed ZnO using probe-corrected and monochromated STEM-EELS. Reprosentralen, University of Oslo. ISSN 1501-7710. Show summary

  The band gap of semiconducting ZnO can be readily tuned through alloying it with other relevant oxides, such as CdO, consequently extending the performance of the corresponding materials and devices. In this context, one of the challenges is to establish the methodology for two-dimensional band gap measurements on the nanometer scale. Here, monochromated electron energy loss spectroscopy (EELS) in combination with probe-corrected scanning transmission electron microscopy (STEM) can be applied, potentially with much greater success compared to traditional techniques with low spatial resolution. However, up to now, the EELS based band gap mapping technique has not seen widespread use, primarily due to its experimental and data processing complexities. In this work, utilizing state-of-the-art probe-corrected and monochromated STEM-EELS platform without particular instrumental design, we developed and applied methods for acquiring large band gap maps with high spatial resolution. A newly-developed efficient computing method was employed to extract band gap maps from the EELS data after proper background subtraction. All these advances are highlighted by the band gap mapping of Zn1-xCdxO/ZnO hetero structure with a spatial resolution well below 10 nm and a high spectral precision. Nevertheless, band gap measurement by EELS are also restricted in spatial resolution, which is fundamentally determined by the delocalization length (L50) of the inelastic scattering process. The origin of this delocalization is the long range electrostatic interactions between the atomic electrons of the sample and the incident high-energy electrons. The EELS plasmon energy map has obviously higher spatial resolution than the band gap map, and its experiment as well as data extraction is also much easier to perform. In order to push the spatial resolving power in EELS band gap analysis further, the relationship between the band gaps and plasmon energies in Zn1-xCdxO was investigated based on the fact that both depend strongly on the unit cell parameter. A robust quantitative correlation was established, providing a simple and straightforward way to calculate the band gap variations just from the easily measured plasmon energy, with improved spatial resolving ability as compared with the conventional EELS approach. In order to further verify the success of the probe-corrected and monochromated STEM-EELS technique, it was put into application to a new system, namely separate ZnCr2O4 nano-inclusions embedded in ZnO matrix. Band gap mapping of ZnCr2O4 nanoparticles in ZnO matrix and their interface was successfully achieved, confirming the validity of this STEM-EELS approach. In addition, probe-corrected STEM enables sub-ångström imaging, from which the realistic structure can be revealed. We employed atomic-resolution images together with geometric phase analysis (GPA) to analyze the structure and strain at ZnCr2O4/ZnO interfaces, which is of critical importance for thin film growth and may affect band gap.

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