Published
Nov. 13, 2019 7:36 AM
The lab in Forskningsparken houses a JEOL JIB-4500, a dual-beam focused ion beam (FIB) that allows sample preparation and investigation. The system is equipped with a Kleindiek micro manipulator needle, as well as a Kleindiek two-point electrical characterization system. The system is often used in conjunction with TEM-lamella fabrication.