FEI Titan G2 60-300

The FEI Titan G2 60-300 is optimized for sub-Angstrom spatial resolution STEM imaging and chemical analysis. Capable of in situ microscopy, studying materials dynamically at atomic resolution using heat, electrical biasing, and gas.

instrument

  • High brightness XFEG with Wien-filter monochromator: 200 meV resolution

  • DCOR Cs probe corrector: 0.8 Å spatial resolution in STEM 
  • Aligned at 60, 200 and 300 kV
  • Super-X EDS detector: 0.7 srad collection angle. 
  • Gatan GIF Quantum ER 965 with Ultrafast DualEELS spectrometer and Omega-q mapping module
  • 6 STEM detectors for BF, ABF, ADF and HAADF STEM imaging.
  • Velox software package: simultaneous EDS and EELS mapping. 
  • Protochips Atmosphere gas cell system: high spatial resolution S/TEM imaging, EELS and EDS in reactive gases and elevated temperature. Gases at pressures up to 1 atm, temperature up 1000 °C.
  • Protochips Fusion Double tilt holder with MEMS-based E-chips for in-situ thermal and electrothermal TEM analysis. Heating up to 1200 °C at any rate up to 1000 ºC/ms.
  • Gatan Double tilt heating holder, up to 850 °C.
  • Gatan Double tilt liquid nitrogen cooling holder, -170 °C to 110 °C.
  • Gatan inert transfer holder.
Published Dec. 3, 2020 3:29 PM - Last modified Dec. 11, 2020 1:52 PM