The XRF Room

X-ray Fluorescence (XRF) is a characterization method for elemental composition for a thin film or a pellet sample.

The XRF instrument is a Malvern-Panalytical Axios Max Minerals Wavelength Dispersive Sequential Spectrometer (WDXRF) equipped with a 4kW Rh-tube and auto sample changer for continuous measurement.

The X-ray fluorescence instrument is used by both the Department of Geoscience and the Department of Chemistry. The instrument is routinely used to measure major and trace element compositions of geological samples, as well as thin films for materials research. It was installed in 2013 in The Department of Geoscience and moved to the Department of Chemistry in 2022.

For more information, please contact Henrik Hovde Sønsteby

Published May 14, 2024 11:47 AM - Last modified May 14, 2024 11:51 AM